
Professor, Materials Science & Engineering
m.aindow@uconn.edu | |
Phone | (860) 486-2644 |
Mailing Address | Materials Science and Engineering 25 King Hill Road, Unit 3136 University of Connecticut Storrs, CT 06269-3136 |
Campus | Storrs |
Link | Department Page |
Google Scholar Link |
Brief Bio
After finishing his degrees at the University of Liverpool in England, Mark spent two years as a Postdoctoral Research Fellow in Ohio, first at Case Western Reserve University in Cleveland and then at The Ohio State University in Columbus. His first faculty appointment was from 1990-1999 in the School of Metallurgy and Materials at The University of Birmingham, England. In 1994 he was a Royal Society/CAS Exchange Scholar at the Beijing Laboratory for Electron Microscopy, PRC.
Mark joined the faculty at the University of Connecticut in 1999. He is currently a Professor of Materials Science and Engineering (MSE). He was the Director of the MSE Program from 2006-2009, Associate Director for the Institute of Materials Science from 2013-2017, and Executive Director for Innovation, External Engagement and Industry Relations in the Office of the Vice President for Research from 2018-2023. He held sabbatical appointments as: Royal Society / Chinese Academy of Sciences Exchange Scholar in the Beijing Laboratory for Electron Microscopy in 1994; Visiting Professor in the MSE Dept. at National Taiwan University, Taipei in 2005; and Visiting Fellow in the Dept. of Applied Physics at Yale University in 2012. He served as Editor for the Journal of Materials Science from 2004-2007 and as Deputy Editor-in-Chief from 2008-2017.
He has published 266 journal papers and 160 papers in refereed conference proceedings. These papers have attracted around 10,000 citations, with an h-index of 52 and an i10-index of 186.
- Novel quasicrystal-reinforced aluminum alloys
- Microstructural development in metal additive manufacturing
- Phase transformations in high temperature aerospace alloys
- Nanostructured materials for catalytic/functional applications
- Defects and interfaces in thin films